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Ray Sheen
Department of Materials and Mineral Resources, National Taipei University of Technology, Taiwan
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Mini Review
Atomic Force Microscope (AFM)-Guided Nanomanipulation System for Nanoscale Assembly: A Revolution in Nanotechnology
Author(s): Ray Sheen*
The Atomic Force Microscope (AFM)-guided nanomanipulation system represents a transformative advancement in nanotechnology, offering unparalleled precision and versatility in the assembly of nanostructures at the atomic scale. This article explores the capabilities, applications, and advancements of AFM-guided nanomanipulation systems in the field of nanoscale assembly. By integrating nanoscale imaging with precise manipulation functionalities, AFM-guided systems enable researchers to observe and control the assembly of nanostructures in real-time. Applications span across various fields including nanoelectronics, nanomedicine, and materials science, where AFM-guided assembly techniques are driving innovation and discovery. Recent advancements in AFM technology, such as automation and machine learning integration, further enhance the capabilities and expand the potential applications .. View more»