Wu W
State Key Laboratory of Automotive Safety and Energy,
Beijing 100084
Indiana
Research Article
Stress Fields Induced by Dislocation Loops in Isotropic CuNb Film-
Substrate System
Author(s): Wu W, Qian G and Cui X
Wu W, Qian G and Cui X
Based on linear superposition rules and fast discrete Fourier transformation, a semi-analytical solution is developed for calculating the elastic fields induced by dislocation loops in an isotropic thin film-substrate system. The elastic field problem of thin film-substrate system is decomposed into two sub-problems: bulk stress due to a dislocation loop in an infinite space, and correction stress induced by free surface and interface of the film-substrate system. Correction elastic field is linearly superimposed onto bulk elastic field to produce continuous displacement and traction stress across the interface plane of the perfectly-bounded film-substrate system. Firstly, calculation examples of dislocation loops in Cu-Nb film-substrate system are performed to demonstrate the calculation efficiency of the developed semi-analytical approach. Then, elastic fields of dislocation loops w.. View More»
DOI:
10.4172/2168-9873.1000205